Please use this identifier to cite or link to this item: http://13.232.72.61:8080/jspui/handle/123456789/2376
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dc.contributor.authorVangipuram, Radhakrishna-
dc.contributor.authorAljawarneh, Shadi-
dc.contributor.authorVinjamuri, Janaki-
dc.contributor.authorKumar, P. V.-
dc.date.accessioned2019-07-12T06:33:53Z-
dc.date.available2019-07-12T06:33:53Z-
dc.date.issued2017-
dc.identifier.citationVangipuram, Radhakrishna., Aljawarneh, Shadi., Vinjamuri, Janaki., & Kumar, P. V. (2017). Looking into the possibility for designing normal distribution based dissimilarity measure to discover time profiled association patterns. International conference on engineering & MIS, 1-5p.en_US
dc.identifier.other10.1109/ICEMIS.2017.8273097-
dc.identifier.urihttp://13.232.72.61:8080/jspui/handle/123456789/2376-
dc.description.abstractThis research addresses the design of a novel dissimilarity measure for mining similar patterns from time stamped temporal databases applying the concept of standard score and normal distribution. The basic idea behind the design of dissimilarity measure is to use and transform supports to zspace and compute the probability of z-score of temporal patterns. The probability is obtained using normal distribution chart. The objective has been to design a normal distribution based dissimilarity measure which can be used to discover all valid similarity- profiled temporal association patterns.en_US
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.subjectComputer Scienceen_US
dc.subjectTemporalen_US
dc.subjectTime Stampen_US
dc.subjectSeasonal Patternen_US
dc.titleLooking into the Possibility for Designing Normal Distribution Based Dissimilarity Measure to Discover Time Profiled Association Patternsen_US
dc.typeArticleen_US
Appears in Collections:Faculty Publications



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