Normal view MARC view ISBD view

Process Variations and Probabilistic Integrated Circuit Design

Manfred Dietrich, Joachim Haase

Process Variations and Probabilistic Integrated Circuit Design - 2012

ISBN: 978-1-4419-6621-6

Subjects--Topical Terms:
Circuits and Systems
Computer-Aided Engineering (CAD, CAE) and Design
Engineering

Print
Add to your cart (remove)
Send to device
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)